Fig. 5.
NE induces a long shut time at +40 and +50 mV. Log binned distributions of shut time measured from control and NE (30 μm) patches. The histogram was generated with 10 bins/decade. The control data are from a single patch that contained one N-channel and at least one Ef-channel. The NE data from 20–40 mV are from one patch, and the data at +50 mV are from a separate patch. Each NE patch contained only a single N-channel. Thesmooth lines were generated from either double or triple exponential fits to the data. The resulting time constants (τsh) are listed along with the number of events used to generate the distribution.